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According to a new report, published by KBV research, The Global Focused Ion Beam Market size is expected to reach $1.9 billion by 2028, rising at a market growth of 7.3% CAGR during the forecast period.
The Device Modification market is showcasing a CAGR of 7.6% during (2022 - 2028). The extensive use of FIB systems in device modification has benefitted the technology by aiding in the development of advanced techniques. These techniques are used for multistep, complex modifications done on the circuits of planar chip technology.
The Ga+ Liquid Metal market is leading the segment in the Global Focused Ion Beam Market by Ion Source in 2021; thereby, achieving a market value of $996.9 Million by 2028. The Ga+ liquid metal is extensively used in the FIB systems that are used for failure analysis in the electronics and semiconductor industry. It is also used in systems that are used in IC modification and repair, TEM sample preparation, ion microscopy, and nanofabrication applications.
The Material Science market is exhibiting a CAGR of 7.8% during (2022 - 2028). The field of material science makes high use of FIB microscopes and serves as the primary factor driving the growth of the segment. Its utilization facilitates high-resolution imaging abled micromachining, thereby enhancing the use of the system in a wide range of technological and fundamental applications.
The North America market dominated the Global Focused Ion Beam Market by Region in 2021; thereby, achieving a market value of $672.7 Million by 2028. The Europe market is poised to grow at a CAGR of 7.1% during (2022 - 2028). Additionally, The Asia Pacific market would witness a CAGR of 8.1% during (2022 - 2028).
Full Report: https://www.kbvresearch.com/focused-ion-beam-market/
The market research report has exhaustive quantitative insights providing a clear picture of the market potential in various segments across the globe with country wise analysis in each discussed region. The key impacting factors of the market have been discussed in the report with the elaborated company profiles of Thermo Fisher Scientific, Inc., Carl Zeiss AG, Hitachi, Ltd., JEOL Ltd., Oxford Instruments plc, Eurofins Scientific SE, Veeco Instruments, Inc., Leica Microsystems GmbH (Danaher Corporation), A&D HOLON Holdings Company, Limited and Raith GmbH
By Application
By Ion Source
By Vertical
By Geography
Companies Profiled
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